扫描电镜

+更多分类

S-4700-I

S-4700-I
详细介绍
Specification S-4700-I
Vintage  
E-beam Resolution 1.5nm @15KV / 2.1nm @ 1kV
Stage 2 Axis, Motorized
Stage Travel 25 x 25 mm
Z, R 26.5mm, 360 deg
Tilt -5 - +45
Sample Entry LL - 4" - 100mm
Chamber View Yes
OS Win XP Pro
Vacuum DP
EDX Optional
BSE Optional
STEM Optional